CMI-Z40 Contour Measuring Instrument
Contour Measuring Instrument

Measuring principle

The measuring principle of this instrument is the rectangular coordinate measuring method ,through X-axis, Z-axis sensor, mapping the surface contour coordinates point of the part under test, data transmission the coordinates point to the upper PC by electrical components. To do the mathematical treatment on the original collected coordinate data by software, marked with the required engineering survey projects


Technical features

  • The machine reference table and Z-axis column material are made of natural granite, the structure is not deformed, and the performance is more stable and reliable

  • The use of X-direction and Z1-direction high-precision grating sensors improves the degree of automation and realizes the measurement function that the sensors can automatically contact

  • The key components adopt special stress-relief alloy materials and special stress-relief treatment process, and the durability and accuracy are kept longer.

  • Technical specifications:

    Item CMI-Z25 CMI-Z40 CMI-Z60
    Measuring range X-axis 120mm
    Z1-axis 25mm 40mm 60mm
    Z-axis 420mm
    Indication accuracy Straightness 0.8μm/100mm 0.5μm/100mm
    X-axis ±(3.0+0.02L)μm ±(1.5+0.025L)μm
    Z1-axis ±(1.5+[0.2H])μm ±(0.8+[0.15H])μm
    Arc ±(2+R/8)μm ±(1.5+R/12)μm
    Angle ±2' ±1'
    Detection method X-axis 0.2μm sensor 0.2μm Electronic digital sensor
    Z1-axis 0.05μm sensor 0.05μm Electronic digital sensor
    Drive speed X-axis 0.1-10mm/S 0.05-15mm/S
    Z-axis 0.5-10mm/S 0.2-15mm/S
    Z1-axis 0.1 · 0.2 · 0.5 · 1mm/s
    Drive mode X-axis Electric (Ultra quiet stepping motor and linear slide)